In-line EL Tester ULC-EL24A

Electroluminescence (EL) is an optical phenomenon and electrical phenomenon in which a material emits light in response to the passage of an electric current or to a strong electric field. EL relies on the same principle as a light emitting diode (LED). Current is fed into a solar cell/ solar module (essentially a large diode) and radiative recombination of carriers causes light emission. As an indirect bandgap semiconductor, most of the recombination in silicon occurs via defects or Auger recombination. The amount of band-to-band recombination producing radiative emission is relatively low. However, there is a small amount of radiative recombination that happens even in silicon and this signal can be sensed using an external detector. EL provides a wealth of data about the area related uniformity of solar cells/ solar modules. It is non destructive and relatively fast with measurement times of 1 s possible.

Inline connecting with automation line, with out maual loading and unloading.
Defects detectable: Soldering defects/ firing defects/ material defects/ micro cracks/ surface contamination/ bus-bar broken/ current mismatch/ dark areas, ...
Testing result can be save and export in different file formats, and testing time,barcode number can be shown on the pricture.